Discusses terminology associated with orientations, texture, and their representation, as well as the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Updated to include experimental details of the latest transmission or scanning electron microscope-based techniques for microstructure analysis, including EBSD. Describes how microtexture data are evaluated and represented and emphasizes the advances in orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Offers new and innovative grain boundary descriptions and examples.